TSR-TT
Microprobe cantilever design: 

TSR-TT scheme

Technical specifications: 
Type TRS-TT.75-PCA-PCS10-50
 Max. spatial resolution 40 µm
 Dark current @ 1 V Bias < 10 nA (typ. <1.5 nA)
 Photocurrent @ 1 V Bias >0.1 µA (typ. >0.25 µA)
 Excitation wavelength 700 .. 860 nm
 Average excitation power 0.1 .. 3 mW
 Connection type 2x SMP

 

TR-series microprobes are mainly sensitive to THz field components oriented in transversal direction to the probe-tip axis as defined by the x-axis direction in the upper illustration.  

Each probe is individually tested and comes with a manual & test certificate. For further information please take a look at our brochure (PDF file, 2 MB) and FAQ section.

Application example (Thin-film inspection*): 

TSR-TT application

*Terahertz test target P-TTT-2-1200 with Cr layers of 10 nm and 50 nm thickness - equivalent to approx. 250 Ohm and 50 Ohm sheet resistance, respectively.