• News
      • Back
      • Events
  • Products
      • Back
      • Scanning systems
      • THz microprobes
          • Back
          • TD-800-X series
          • TD-800-TR series
          • TD-800-Z series
          • TD-1550-X series
          • TD-1550-Y-BF
          • Starter-kit
          • XR-option
          • WT-option
      • Schottky-diode probes
      • THz emitters
      • Low noise amplifier
      • Sub-systems
          • Back
          • D-B1-TR
          • D-B1
          • D-B2
      • Accessories
          • Back
          • Terahertz Test Target
          • TeraSpike Defender
          • SHG-Unit
          • Microprobe dummy
          • Connection cable
      • Product Inquiries
  • Services
      • Back
      • Sheet resistance
      • Chip inspection
      • Near-field imaging
      • Waveguide analysis
      • Service Inquiries
  • Technology
      • Back
      • Background
      • FAQ
      • Downloads
      • Publications
  • Company
      • Back
      • Profile
      • Management
      • Directions
      • Contact us

Products

  • Scanning systems
  • THz microprobes
  • Schottky-diode probes
  • THz emitters
  • Low noise amplifier
  • Sub-systems
  • Accessories
  • Product Inquiries

Sub-systems

The integration of TeraSpike microprobes into existing optoelectronic set-ups is simplified through the use of standardized optical mounting components and the following sub-systems featuring further basic funtions.

Sub-system D-B1-TR

Sub-D-B1-TR

The core sub-system D-B1-TR is a mini-board module with pre-aligned opto-mechanical components for the system integration of the TeraSpike transceiver microprobe series (TR).

Functions:
  • Microprobe fixation
  • Manual beam-to-microprobe focusing (for two beams)
  • Manual beam-to-microprobe alignment (for two beams)
  • Manual microprobe height variation
 

Sub-system D-B1

Sub-D-B1 w sd-tags-500n

The core sub-system D-B1 is a mini-board module with pre-aligned opto-mechanical components for the system integration of TeraSpike microprobes

Functions:
  • Microprobe fixation
  • Manual beam-to-microprobe focusing
  • Manual beam-to-microprobe alignment
  • Manual microprobe height variation
 

Sub-system D-B2

Sub-D-B2-650

Sub-system D-B2 is a vertical breadboard platform holding the core module D-B1 as well as further beam guiding components. It is offering enough space for additional components such as a CCD camera for probe-tip monitoring or a distance sensor for the sampling of profiled or tilted sample surfaces.

Content:
  • Motherboard including sub-system D-B1 in customized height
  • Assembly brackets
  • 2 alignment apertures
  • 2 tilt mirrors
  • Extendable with further components such as CCD camera and distance sensor
Optional extension:
  • Sub-D-B2-CAM: Integrated CCD microscope camera system with variable illumination for monitoring of probe-tip to sample surface approximation and sample positioning 

dual light cam extension sample image 300Exemplary CCD camera image of a TeraSpike microprobe tip above sample microstructure.

 

 
© 2014 - 2023 Protemics GmbH