A near-field microprobe sensitive to THz field components transversal to the tip axis — down to 3 µm spatial resolution. Each probe is individually tested and ships with a manual and test certificate.
The TD-800-X is available as HR and HRS. Values per individually tested probe.
| Parameter | HR | HRS |
|---|---|---|
| Max. spatial resolution | 3 µm | 20 µm |
| Photo-switch gap size | 1.5 µm | 2 µm |
| Dark current @ 1 V bias | < 0.5 nA | < 0.5 nA |
| Photocurrent @ 1 V bias | > 0.2 µA | > 0.2 µA |
| Excitation wavelength | 700–860 nm | 700–860 nm |
| Average excitation power | 0.1–4 mW | 0.1–4 mW |
| Connection type | SMP | SMP |
X-series microprobes are sensitive to THz field components oriented transversal to the probe-tip axis (x-direction). Each probe is individually tested and ships with a manual and test certificate.
The HR option omits the resonant antenna element, providing a somewhat higher bandwidth and the finest spatial resolution (3 µm).
The HRS option adds a resonant antenna element for enhanced sensitivity around 1 THz, trading some spatial resolution.
Probe the transversal near-field of emitters, waveguides, plasmonic and sensor surfaces with low invasiveness.
Map field distributions and isolate faults on-chip with sub-picosecond, contactless time-domain measurements.
Tell us your excitation source and target resolution — we'll recommend HR or HRS and the right configuration.