A near-field microprobe sensitive to THz field components longitudinal to the tip axis — with 8 µm spatial resolution. Together with the X-series it gives access to the field polarization in all three dimensions.

Each probe is individually tested and ships with a manual and test certificate.
Z-series probes detect the field component along the probe-tip axis (z). In the standard configuration the probe stands perpendicular to the sample, so z is the out-of-plane field — the component that X-series probes cannot see.
| Parameter | N | A-500G |
|---|---|---|
| Max. spatial resolution | 8 µm | 8 µm |
| Photo-switch gap size | 2 µm | 5 µm |
| Dark current @ 1 V bias | < 0.4 nA | < 0.4 nA |
| Photocurrent @ 1 V bias | > 0.1 µA | > 0.2 µA |
| Excitation wavelength | 700–860 nm | 700–860 nm |
| Average excitation power | 0.1–4 mW | 0.1–4 mW |
| Connection type | SMP | SMP |
Map the z-component of resonant surfaces, where the strongest near-field often points out of the plane.
Metamaterials & plasmonics →Image guided THz modes on planar metal and dielectric waveguides with low invasiveness.
On-chip spectroscopy →Tell us your excitation source and target frequency range — we'll recommend N or A-500G and the right options.